- When scanning electron beam is injected into the sample, the atom is absorbed by absorbing energy.

As the electrons are stabilized, the X line is stabilized, which is released, X line is released, and X line is unique energy values every material.

Therefore, you can collect X lines and classified X line with the collected X line for sample.

1. Since EDS equipment is used simultaneously with SEM (scanning electron microscope), component analysis is possible for each part of the sample.  

In addition, component analysis is possible with a relatively small amount of samples, and it has the advantage of fast analysis time.  

2. EDS analysis uses an electron beam as an energy source, making it impossible to analyze if the sample is magnetic.  

3. Because EDS is an equipment used with SEM, pre-processing such as fixing and coating of samples (materials with low electrical conductivity) is required.  

4. The liquid sample cannot be analyzed because the SEM is vacuum equipment.  

5. EDS can be analyzed from element B, but the reliability of organic components is low.